第三方集成电路IP质量评测过程与案例分析  

A Qualification Process Model for Silicon IP and Case Study

作　　者：周萌[1] 赵辉[1] 梁平[1] 孙加兴[1] 谢学军[1] 邱善勤[1] 

机构地区：[1]工业和信息化部软件与集成电路促进中心

出　　处：《中国集成电路》2011年第9期82-87,共6页China lntegrated Circuit

摘　　要：本文提出了一种基于第三方的集成电路IP质量评测过程,基于第三方过程的IP评测案例分析表明,该过程能够有效地提高集成电路IP项目的可交付项质量。同时本论文使用该评测过程的应用案例,对进一步的集成电路IP质量发展提出了若干建议。This paper proposes a new semiconductor IP quality appraisal method based on the third party. Case studies demonstrate the third party quality appraisal process for semiconductor IP can improve the IP quality of projects with limited cost. The quality appraisal results also show the states of current IP quality have an improved space. Some suggestions about improving IP quality in IP project have been proposed as conclusion.

关 键 词：集成电路IP IP质量模型 评测 

分 类 号：TN407[电子电信—微电子学与固体电子学]