基于结构函数的LED热特性测试方法  

Thermal Characteristics Test Based on the Structural Function Theory

作　　者：赵学历[1] 金尚忠[1] 王乐[1] 梁培[1] 岑松原[1] 曹宇杰[1] 李璇[1] 李亮[1] 

机构地区：[1]中国计量学院光学与电子科技学院,杭州310018

出　　处：《光电工程》2011年第9期115-118,共4页Opto-Electronic Engineering

基　　金：国家自然科学基金(61006051);浙江省自然科学基金(Y407370)

摘　　要：本文基于结构函数理论出发,研究了LED热特性测试的方法。通过改变LED样品的功率输入,利用热测试设备测试LED样品的瞬态温度变化曲线,再通过对温度变化曲线进行处理,抽取出结构函数,从而分析出LED样品的热阻和热容等热属性参数。与常规方法相比,这种测试方法具有非破坏性的优点,能够更加准确的测量出LED各个部分的热阻分布,而且结果可视效果好,是评价大功率LED热特性的有效评测手段之一。To measure the thermal characteristics of LED,one method based on the structural function theory was studied.Thermal test equipment was used to measure the transient temperature curve of LED samples by changing the power input of LED.Then,the parameters such as thermal resistance and thermal capacitance can be analyzed through structure function extracted from the temperature curve.Compared with conventional methods,the method has the nondestructive advantages.Furthermore;it can measure more accurately the distribution of each part of the LED with good visual effect.So it is one of the effective means to evaluate the thermal characteristics of high power LED.

关 键 词：热阻 T3Ster 结构函数 大功率LED 

分 类 号：TN312.8[电子电信—物理电子学]