基于故障映射的FPGA互连资源故障测试与定位  

Fault mapping based algorithm for fault detection and diagnosis of the interconnects in SRAM-based FPGAs

作　　者：项传银[1] 阮爱武[1] 李文昌[1] 王林[1] 廖永波[1] 

机构地区：[1]电子科技大学电子薄膜与集成器件国家重点实验室,成都610054

出　　处：《仪器仪表学报》2011年第9期2010-2015,共6页Chinese Journal of Scientific Instrument

摘　　要：由于FPGA互联资源故障定位是FPGA故障测试的一个难点,尤其需要准确地判断故障的类型和精确地定位故障的位置,因此文中提出一种通过故障映射方法将SRAM型FPGA的互连资源故障映射到LUT的输出上,间接地测试与定位互连资源故障的一种方法。同时将故障映射这种方法与传统经典的三次配置测试互连资源方法的核心思想相结合,在高故障率的FP-GA中实现了互连资源的100%故障测试覆盖率,并精确地将故障定位至FPGA互连金属线段或PIP对。该算法采用了最小可重复单元结构,FPGA中被测试资源可以由连续或不连续的任意数量最小可重复单元组成,因此更适合FPGA的重复性结构和FPGA的在线测试。在FPGA的在线全覆盖测试中,该算法的最小迭代测试(ROTE)次数与FPGA的规模无关,只与用户应用电路所占FPGA总资源的比例相关。Fault detection and diagnosis of programmable Interconnect Resources （IRs） poses challenge for FPGA testing, especially when it is necessary to decide fault type and fault location accurately. A fault mapping algorithm for fault detection and diagnosis of IRs is presented in this paper, which maps the faults of IRs to the outputs of corresponding LUTs. Combined with typical methodology of three testing configurations （TCs） of IRs, the proposed algorithm can achieve 100% fault coverage and locate faults in interconnect metal lines or PIP pairs even for high fault density FPGAs. The algorithm is applicable to integrated circuits like FPGAs consisting of many repeatable units, as well as in FPGA online testing. In FPGA online full coverage testing, the minimum iteration test number is independent of FPGA size and only relevant to the ratio between the resource occupied by the configured user circuit and total FPGA resource.

关 键 词：FPGA测试 最小可重复单元 故障映射 故障测试与定位 

分 类 号：TP206.1[自动化与计算机技术—检测技术与自动化装置]