Influencing factors on local reduction of graphene oxide with a heated AFM tip  

作　　者：WU Zhongliang SHEN Yue ZHOU Xingfei GUO Shouwu ZHANG Yi 

机构地区：[1]Ningbo University, Zhejiang 315211, China [2]Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Shanghai 201800, China [3]Research Institute of Micro/Nano Science and Technology, Shanghai Jiao Tong University, Shanghai 200240, China

出　　处：《Nuclear Science and Techniques》2011年第4期245-250,共6页核技术（英文）

基　　金：supported by National Basic Research Program of China (No. 2007CB936000);Chinese Academy of Sciences (No. KJCX2-EW-N03);National Science Foundation of China (No. 10975175,90923002,and 90923041)

摘　　要：In this paper,the factors influencing the local thermal reduction of graphene oxide (GO) sheets are investigated.The lateral force microscopy and scanning polarization force microscopy verify that the heated tips of atomic force microscope (AFM) can thermally reduce the GO into electrical conductive nanostructures.The tip temperature,heating time,and loading force applied by the AFM tip are found to have important effects on the thermal reduction of GO,while the environmental humidity is negligible.In this paper, the factors influencing the local thermal reduction of graphene oxide （GO） sheets are investigated. The lateral force microscopy and scanning polarization force microscopy verify that the heated tips of atomic force microscope （AFM） can thermally reduce the GO into electrical conductive nanostructures. The tip temperature, heating time, and loading force applied by the AFM tip are found to have important effects on the thermal reduction of GO, while the environmental humidity is negligible.

关 键 词：石墨氧化物 影响因素 针尖 原子力显微镜 纳米结构 加热时间 环境湿度 热还原 

分 类 号：TB43[一般工业技术] TQ323.8[化学工程—合成树脂塑料工业]