FPGA测试配置完备性的分析评价方法  

A Technique for FPGA Test Configuration Analysis and Evaluation

作　　者：周发标[1,2] 杨海钢[1] 秋小强[1,2] 王飞[1] 

机构地区：[1]中国科学院电子学研究所可编程芯片与系统研究室,北京100190 [2]中国科学院研究生院,北京100049

出　　处：《计算机辅助设计与图形学学报》2011年第10期1672-1679,共8页Journal of Computer-Aided Design & Computer Graphics

基　　金：国家重大科学研究计划(2011CB933202)

摘　　要：测试配置开发是FPGA测试中的重要环节之一,为加快FPGA测试配置开发进程,提出一种基于配置词典的FPGA测试配置分析评价方法.首先建立FPGA基本可编程单元的配置词典,给出其完备测试需要的所有配置码;然后采用模板化的方法分析测试配置,计算测试配置对配置词典的覆盖率;最后根据计算的覆盖率评价测试配置的完备性.实验结果表明,文中方法能够正确地评价测试配置的完备程度,报告测试配置所有可测和不可测的FPGA资源;与故障仿真方法相比,该方法的时间复杂度从O(kpn2)减少到O(kn′),运行时间从数百小时缩短到几分钟,且运行时间独立于FPGA的阵列规模.Test configuration development is an essential step in FPGA test, to accelerate the development, a technique for FPGA test configuration analysis and evaluation based on configuration dictionary is presented in this paper. Firstly, the proposed method builds configuration dictionary of the basic programmable cells in FPGA, which contains all the configurations that the full test needs. Then the template method is used to analyze the test configuration and compute the coverage of the test configuration to the configuration dictionary. Experimental results show that the proposed method can perform exact evaluation to test configuration and report the detected and undetected FPGA resource of the test configuration. Compared with fault simulation method, it reduces time complexity from O（kpne） to O（kn＇） and is several orders of magnitude faster. Furthermore the operating time is independent of FPGA size.

关 键 词：FPGA 测试覆盖率 故障仿真 测试配置 

分 类 号：TN402[电子电信—微电子学与固体电子学]