凸度仪电离室探测器时间响应特性研究  

Study on Time Response Properties of Ionization Chamber in Profile Gauge

作　　者：王振涛[1] 沈毅雄[1] 王立强[1] 郝朋飞[1] 

机构地区：[1]清华大学核能与新能源技术研究院,北京102201

出　　处：《原子能科学技术》2011年第9期1128-1131,共4页Atomic Energy Science and Technology

基　　金：国家自然科学基金资助项目(10875068);北京市科技计划资助项目(Z080903027508);清华大学自主科研计划资助项目(2010THZ02-1)

摘　　要：本文利用脉冲X射线机发射宽度很短的脉冲射线,通过分析数字示波器记录的电离室负载电阻上的电压信号,测量电离室内的离子漂移时间。利用该方法对凸度仪电离室探测器的时间响应特性进行了研究,给出了不同内部结构、不同电压及不同气压的电离室离子漂移时间的测量结果,并分析了误差产生的原因。实验结果表明,凸度仪电离室的时间响应满足在线测量热轧钢板的要求。The drift time of ions in the ionization chamber was measured by means of using a shortly pulsed X-ray device and through analyzing the voltage signals on the load resistor of the chamber recorded by a digital oscilloscope.By using this method,the time response properties of the ionization chamber in the profile gauge were studied,results of ion drift time for ionization chambers with different internal structures,different voltages and different gas pressures were introduced and the sources of error were discussed.The experiment results show that the time response of ionization chamber in profile gauge meets the requirement of on-line hot strip measuring.

关 键 词：时间响应特性 电离室 凸度仪 离子漂移 

分 类 号：TL81[核科学技术—核技术及应用]