基于侧面抛磨的光纤SPR传感器研究  

Characterization of SPR sensor utilizing side polished fiber

作　　者：单良[1,2] 马晓红[1] 赵华凤[1] 

机构地区：[1]清华大学电子工程系,北京100084 [2]University of Bristol Engineering Department Bristol BS81TH,UK

出　　处：《辽宁师范大学学报（自然科学版）》2011年第3期296-299,共4页Journal of Liaoning Normal University:Natural Science Edition

基　　金：国家自然科学基金项目(60677035);国家高技术研究发展计划(863计划)项目(2006AA10Z209)

摘　　要：在设计并搭建光纤侧面抛磨平台的基础上,研制可用于表面等离子体传感器的侧面抛磨光纤,并给出实验检测测量效果.首先理论模拟光纤SPR传感器在制作过程中以及完成后的性能变化,找到理想的工艺参数和测量效果的关系,然后进行设计并搭建光纤侧面抛磨平台,可实现对光纤抛磨的深度,长度,光插入损耗等物理量的实时在线控制,最后对制成的光纤抛磨样品进行测量,来验证整套装置.根据实验结果,光纤抛磨样品的测量分辨率为3×10-4RIU,峰峰值大于0.1 dB.This paper describes a noble method to manufacture side polished fiber which could be applied for SPR sensor.The process is based on a self-design and built side polished system.Firstly,the theoretical analysis has been done to simulate the performance of the fiber during the side polishing process and when it is finished.That is to find out the proper relationship between measure results and manufactory parameters.Then the side polished system has been designed and built to fulfill the task while overseeing the depth,length and loss of the fiber during the process.In the end,experiments have been done to verify the fiber sensor.According to the experiments,the resolution is 3×10-4RIU and peak to peak is bigger than 0.1 dB.

关 键 词：表面等离子体 侧面抛磨 光纤SPR传感器 

分 类 号：TP212.14[自动化与计算机技术—检测技术与自动化装置]