SOC技术与发展预测  

SOC technology and development prediction

作　　者：闫瑾[1] 

机构地区：[1]黑龙江大学电子工程学院,哈尔滨150080

出　　处：《信息技术》2011年第9期188-190,共3页Information Technology

摘　　要：随着集成电路的高速发展,SOC(System on Chip)技术已经成为当今的重要发展方向。总线的选择对于SOC来讲至关重要,通过对当今比较标准的coreconnect总线,AMBA总线,Wishbone总线以及OCP总线之间的比较,了解总线的特征。随着SOC集成度的增加,性能的提高,测试技术变的至关重要,重点介绍三种测试技术——基于扫描测试,边界扫描测试以及内建自测试技术。验证是SOC中最重要的环节,通过对验证方法的说明,预测今后SOC的发展方向。With the rapid development of integrated circuit,the SOC technology has become one of the most important development diredtion.The choice of the bus for the SOC is very important,through the terms of the more standard coreconnect bus,AMBA bus,comparison between Wishbone bus and OCP bus to introduce the characteristics of the bus.Along with the increase of SOC integration,the improvement of the performance,the test technology becomes very important,and this paper mainly introduces three test technology,based scanning test,the boundary scan test and built-in self test technology.Validation is the most important link in the SOC,by explaining the verification method to predict the development direction of SOC in the future.

关 键 词：SOC SOC验证 SOC总线 SOC仿真 

分 类 号：TN98[电子电信—信息与通信工程]