相关性校准法上升沿抽点和线性关系的合理性  

Proof of Rationality of Sampling from Curves'Rising Edge and Linear Relation on Calibration Method of Correlation for Micro Electronic Piezo Gauge

作　　者：梁高翔[1] 马铁华[1] 张艳兵[1] 

机构地区：[1]中北大学电子测试技术国家重点实验室,山西太原030051

出　　处：《探测与控制学报》2011年第4期77-80,共4页Journal of Detection & Control

基　　金：中北大学电子测试技术国家重点实验室基金项目资助(9140C120704070C12)

摘　　要：相关性校准法已广泛应用于微型电子测压器的校准中,为了证明其合理性,应用新概念动态测试、动态测量原理和随机过程的相关理论,从校准过程分析和峰值误差要求两方面论证了上升沿抽点的合理性,从其线性相关系数不小于0.999 7论证了线性关系的合理性。实验结果表明:相关性校准法上升沿抽点和线性关系的合理性论证是正确的。Correlation calibration method has been used extensively for micro electronic piezo gauge calibration.The rationality of points sampling from the curves＇ rising edge was proved through Calibration process analysis and peak error requirements,and the linear relation between input and output was proved that their correlation coefficient was not less than 0.999 7.Relevant theory of new concept dynamic test,principle of dynamic measurement and random course were used.Experiments＇ results showed that the proof of the rationality was right.

关 键 词：微型电子测压器 相关性校准法 准动态校准 

分 类 号：TM930.12[电气工程—电力电子与电力传动]