纳米二氧化硅粒径分析  

Analysis of particle size of nano silica

作　　者：邹涛[1] 周素红[1] 

机构地区：[1]北京市理化分析测试中心,北京100089

出　　处：《现代仪器》2011年第5期81-83,共3页Modern Instruments

摘　　要：本文对2个系列的纳米二氧化硅样品进行粒径分析。对单分散的纳米二氧化硅颗粒分别采用透射电镜和图像分析法、X射线小角散射法和动态光散射法测定其粒径,得到一致的结果。采用2种图像分析软件对另一纳米二氧化硅颗粒的透射电镜照片统计其粒径,得到一致的结果。Particle sizes of two series of nano silica were measured. Three methods including transmission electron microscopy, small angle X-ray scattering and dynamic light scattering were adopted respectively to measure the particle size of nano silica particles. The results obtained were similar. We measured the particle size of another series of nano silica by two kinds of image analysis software. The results were coincident.

关 键 词：二氧化硅 粒径 透射电镜 X射线小角散射 动态光散射 

分 类 号：TQ127.2[化学工程—无机化工]