氢氧化镍正极材料的X射线衍射峰强比与其电化学性能关系研究  

Study on the Relationship between the Intensity Ratio of X-ray Diffraction Peaks and Electrochemical Performance of Ni(OH)_2 Cathode Material

作　　者：杨慧[1] 蒋文全[1] 傅钟臻[1] 于丽敏[1] 郭荣贵[1] 李涛[1] 

机构地区：[1]北京有色金属研究总院分析测试研究所,北京100088

出　　处：《分析科学学报》2011年第5期573-576,共4页Journal of Analytical Science

基　　金：国家质检总局社会公益项目(No.2008424742)

摘　　要：利用"管道式合成"方法合成了5种成分相同、结构不同的Ni(OH)2样品。采用X射线衍射(XRD)、场发射扫描电镜表征材料的微观结构及参数。测试了材料的电化学性能,考察了I101/I001比值与Ni(OH)2材料电化学性能的关系。研究结果表明,随I101/I001比值的增大,样品的电化学性能呈下降的趋势。说明XRD峰强比可以作为快速表征相同制备方法及成分的Ni(OH)2材料性能的方法,简化了现有测试手段。5 kinds of Ni（OH）2 were prepared by the ＂conduit synthesis technology＂ which have same chemical contents and different micro-structures.The physical structure and morphology of the samples were characterized by X-ray diffraction and field emission scanning electron micrographs.The electrochemical performance of samples was characterized.It is found that electrochemical performance of samples devastated following the increase of values of I101/I001,which indicate that value of I101/I001 can be used to characterize the qualities of Ni（OH）2 which is made by identical way and has same chemical contents,so as to simplify present testing method.

关 键 词：氢氧化镍 X射线衍射峰强比 性能表征 

分 类 号：O657.3[理学—分析化学]