一种电子元器件高加速寿命试验指标的探讨  

Proposing a Kind of Highly Accelerated Life Test Index for Electronic Components

作　　者：张鼎周[1] 

机构地区：[1]中国电子科技集团第二十八所,江苏南京210007

出　　处：《电子质量》2011年第10期64-66,共3页Electronics Quality

摘　　要：高加速寿命试验用于识别设计缺陷和制造问题,提高设计强度极限,但不能评估产品的可靠性。该文在分析了产品可靠性可以通过相对性评估的基础上,探讨了在高加速寿命试验的框架下的半数失效时间(FT50)评价指标和试验方法,并讨论了它用于电子元器件可靠性评估的方式。Highly Accelerated Life Test used to identify design flaws and manufacturing problems,improving the design ultimate strength.But it can not assess the reliability of the product.Based on the analysis of product reliability it can be relative assessed.Proposing a kind of highly accelerated life test index for electronic components,median failure time（FT50） and test methods.It was discussed for its assessment of the reliability of electronic components used in the way.

关 键 词：可靠性 高加速寿命试验 半数失效时间 

分 类 号：TN606[电子电信—电路与系统]