故障绝缘子的发热机理及其红外热像检测  

Heating Mechanism and Infrared Thermography Detection of Failure Insulators

作　　者：金光熙[1] 权光日 郎成[1] 于东林[1] 许承蓓[1] 

机构地区：[1]吉林化工学院理学院,吉林吉林132022 [2]吉林市朝鲜族中学校,吉林吉林132001

出　　处：《电瓷避雷器》2011年第5期12-15,共4页Insulators and Surge Arresters

摘　　要：绝缘子故障主要指绝缘电阻劣化和表面污秽。在分析讨论引起绝缘子发热的电阻劣化和表面污秽机理基础上,利用绝缘子等值电路模型分析了绝缘子在电阻劣化和表面污秽时的发热规律以及实际运行绝缘子的热像特征。结果表明:低值、零值和污秽绝缘子的发热规律和热像特征具有明显的差异,故可用高分辨的红外热像仪来检测和分析实际运行中的绝缘子运行状态。Insulator failure mainly refers to the contamination. Based on the mechanism of resistance insulation resistance deterioration and the surface deterioration and surface contamination caused by insulator heating, the heating regular and thermal imagery characteristics of actual service insulator are analyzed by using the insulator equivalent circuit model when resistance deterioration and surface contamination. The result shows that： there are obvious differences among low resistance, zero resistance, and the heating regular and thermal image characteristics of contaminated insulator. Thus thermal infrared imager with high resolution can be used to detect and analyze the insulator operating conditions under actual operation.

关 键 词：绝缘子故障 发热机理 热像特征 红外热像 

分 类 号：TM216[一般工业技术—材料科学与工程]