基于亚像素边缘定位的排针参数精密测量  

Accurate Measurement for Pin Parameters Based on Subpixel Edge Localization

作　　者：顾裕丰[1] 刘国栋[1] 

机构地区：[1]江南大学物联网工程学院,无锡214122

出　　处：《计算机系统应用》2011年第11期189-192,共4页Computer Systems & Applications

摘　　要：为了提高排针参数的检测效率和精度,提出了一种利用亚像素边缘定位对排针进行非接触测量的方法。首先采用LOG算子对图像进行整像素级的边缘粗定位,在抑制噪声的同时,保持图像边缘的完整性。然后采用改进的Zernike矩进行亚像素边缘定位。最后通过最小二乘法拟合离散的边缘点得出排针的精确边缘。实验结果表明,该方法边缘定位精度高,稳定性好,满足排针在线检测的要求。In order to improve detection efficiency and accuracy of pin parameters, a non-contact measurement method of pin based on subpixel edge localization is presented in this paper. Firstly, LOG operator is used to seek approximate localization on pixel level, which can keep the intact edge information of image while restraining the noise. Then, improved Zernike moment is used to abstract subpixel edge localization. Finally, the exact edge of pin is gained from the discrete subpixel points using the least square fitting method. The experimental results show that this method can locate the edge with high accuracy and good stability, and satisfy the request of the on-line detection of pin.

关 键 词：边缘定位 排针 亚像素 LOG算子 ZERNIKE矩 

分 类 号：TP391.41[自动化与计算机技术—计算机应用技术]