基于激光散斑照相术的三维变形测试  

Three-Dimensional Deformation Testing Based on Laser Speckle Photography

作　　者：张文静[1] 黄芳[1] 王文生[1] 

机构地区：[1]长春理工大学现代光学测试实验室,吉林长春130022

出　　处：《激光与光电子学进展》2011年第11期111-116,共6页Laser & Optoelectronics Progress

基　　金：总装备部预研基金(9140A17060306BQ0303)资助课题

摘　　要：基于散斑照相术的基本原理,利用电荷耦合器(CCD)记录,电寻址液晶(EALCD)再现,从而对物体三维变形进行了相位的测试。用数字技术实时显示干涉条纹,取代了传统散斑照相术中的记录干板,省去了传统方法中干板显影、定影等化学处理过程;利用数字图像处理技术实现了四步相移法,并通过相位展开实现了三维变形相位测试,省略了压电位移器、位移控制器等器件,简化了测试系统,缩短了测试时间,测试精度容易达到λ/10。实验研究表明,该研究方法简单、高效,能快速获得具有高对比度的散斑条纹。Based on the principle of speckle photography, with charge-coupled device （CCD） as a recorder, electrically addressed liquid crystal display （EALCD） as a read-out element, the 3D phase measurement of a deformed object is performed. Using digital technology interference fringes displayed in real-time, instead of recording media used in the traditional speckle photograpy, can leave out the chemical process of developing and fixing. Using digital image processing technology realizes four steps phase shitting and with phase-unwrapping method 3D deformation phase testing is realized. So piezoelectric translator （PZT）,phase controller and so on can be omitted, thus testing system is simplified, testing time is reduced and testing precision can easily reach up to λ/10 . The experimental result shows that the research method is not only simple and high-efficiency, but also can obtain high contrast speckle fringes.

关 键 词：测量 散斑照相术 电荷耦合器 电寻址液晶 四步相移法 三维变形测试 

分 类 号：TN29[电子电信—物理电子学]