基于FPGA的高精度相位差测量算法实现  

Implementation of High Precision Phase Difference Measurement Algorithm Based on FPGA

作　　者：郎杰[1] 邹建彬[1] 张尔扬[1] 

机构地区：[1]国防科学技术大学电子科学与工程学院,湖南长沙410073

出　　处：《现代电子技术》2011年第21期28-30,33,共4页Modern Electronics Technique

摘　　要：首先介绍了两种高精度相位差测量算法,一种是基于直接数字频率合成(DDS)的相关测量法,另一种是基于快速傅里叶变换(FFT)的FFT测量法。其次,通过理论仿真分析两种算法在不同信噪比和数据长度下的性能,并在此基础上给出了硬件平台的设计方案。最后,基于高性能的FPGA芯片XC5SX95T,搭建了硬件实验平台,完成了两种相位差测量算法的硬件实现。经过实测,该硬件平台能够达到良好的相位差测量精度。Two kinds of high precision phase difference measurement algorithms are presented： correlation measurement based on direct digital synthesize （DDS） and FFT measurement based on fast Fourier transform （FFT）. The performance of these two algorithms under different SNR and data length are analyzed by theoretical simulation, and a design scheme of hardware platform is proposed. The two kinds of phase difference algorithms are realized on the hardware platform where the core of the platform that is high performance FPGA chip XCSSX95T is implemented. The hardware platform can achieve a well precision through the real-time measurement results of phase difference.

关 键 词：相位差 相关 FFT FPGA 

分 类 号：TN874-34[电子电信—信息与通信工程]