基于FPGA的液晶盒厚快速测量系统  

Fast Liquid Crystal Cell Thickness Measurement System Based on FPGA

作　　者：陈洪财[1] 张荣学 孙名伟 

机构地区：[1]韩山师范学院,广东潮州521041 [2]潮州市创佳电子有限公司,广东潮州521000 [3]汕头市锐科电子有限公司,广东汕头515800

出　　处：《电视技术》2011年第22期92-94,共3页Video Engineering

基　　金：广东省部产学研结合项目(2010B090400291)

摘　　要：在复杂的液晶显示器制造工艺中,液晶盒厚及其测量对液晶滴入量起着关键作用,进而影响液晶显示器件的底色及响应速度等光电特性。从光干涉原理出发,以FPGA为核心芯片,利用倾角传感器、光电传感器等模组设计了液晶盒厚快速测量系统,通过实验验证,系统具有误差小,设备简单,操作快捷等特点,满足液晶盒厚在线自动测量的同时,相对标准差提高到0.02%以上,充分满足了液晶显示器件生产厂家进行盒厚过程监控和液晶量准确计算的需要。LCD display in a complex manufacturing process, the liquid crystal cell gap and the measurement of the amount of liquid drops play a key role, thereby affecting the background color liquid crystal display optical properties and response speed. From the optical interference principle, the core of the chip, FPGA, using angle sensor, photoelectric sensor module designed to quickly measure the thickness of liquid crystal system. Through experi- ments, this system has small error, equipment is simple, quick operation and other characteristics. To meet the thick liquid crystal cell line automatic measurement at the same time, the relative standard deviation is increased to 0.02%, and fully meet the liquid crystal display manufacturers for process monitoring and liquid crystal cell gap accurately calculate the amount of need.

关 键 词：光干涉 液晶盒厚 现场可编程门阵列 

分 类 号：TN949[电子电信—信号与信息处理] O438.1[电子电信—信息与通信工程]