凸度仪校准片厚度序列选取的理论分析和仿真  

Theory Analysis and Simulation of Thickness Series for Reference Samples Used in Calibration of X-ray Instantaneous Profile Gauge for Steel Strip

作　　者：邢桂来[1] 张玉爱[1] 苗积臣[1] 

机构地区：[1]清华大学核能与新能源技术研究院,北京100084

出　　处：《原子能科学技术》2011年第10期1247-1249,共3页Atomic Energy Science and Technology

基　　金：国家自然科学基金资助项目(10875068);北京市科技计划资助项目(Z080903027508)

摘　　要：用一定厚度的校准片进行标定,是X射线测厚设备使用前必须完成的关键工作。选取的校准片越多,系统标定曲线的精度越高,但同时成本也会随之增加。本文以实际构建的X射线热轧钢板凸度测量系统为研究对象,通过TASMIP方法生成X射线能谱,用该能谱对射线经过钢板的衰减规律进行分析,完成了对校准片选取的仿真计算。给出了实际中可应用的厚度序列实例。In order to measure thickness accurately,it＇s important for the X-ray thickness measurement equipment to be demarcated using some reference samples.The more reference samples are taken,the more accurate the calibration curve is;but the system cost will be higher in the same time.Based on the profile gauge for steel strip,X-ray spectrum was generated using the TASMIP method.By analyzing the attenuation principle of the spectrum in the steel strip,the series of the reference samples was calculated.The thickness series,which could be used in practice was given.

关 键 词：凸度仪 校准片 X射线能谱 

分 类 号：TL99[核科学技术—核技术及应用]