PANI/SSAMAPLE膜的短波激光制备及结构表征  

Deposition and characterization of PANI/SSA films by MAPLE technology

作　　者：王卫[1,2] 李承祥[2] 盛六四[2] 

机构地区：[1]石河子大学化学化工学院,新疆兵团化工绿色过程重点实验室,石河子832003 [2]中国科学技术大学国家同步辐射实验室,合肥230029

出　　处：《科学通报》2011年第31期2567-2573,共7页Chinese Science Bulletin

摘　　要：以KrF准分子激光器为光源,利用MAPLE(matrix-assisted pulsed laser evaporation)技术制备了磺基水杨酸掺杂聚苯胺(PANI/SSA)薄膜,利用红外光谱(FTIR)、紫外-可见吸收光谱(UV-vis)、X射线光电子能谱(XPS)和X射线衍射(XRD)对薄膜结构和组成进行了分析研究.结果显示,在基质分子的保护作用下,复合材料的有机结构得到了有效的保护,但聚苯胺的分子量和与掺杂有关的结构发生了一定的变化.实验结果同时显示,SSA掺杂的PANI薄膜具有一定的晶态结构.We deposited PANI/SSA thin films by MAPLE technology using a KrF excimer laser and characterized the films by FTIR, UV-vis, XPS and XRD. We found that under the protection of the matrix the characteristic structures of PANI were effectively protected. The molecular chain and the structures related to doping changed. The results also showed that the PANI/SSA films are in a crystalline state.

关 键 词：PANI/SSA 薄膜 基质辅助脉冲 激光蒸发 掺杂 晶态 

分 类 号：TN249[电子电信—物理电子学] O484.1[理学—固体物理]