不同等离子几何体下He I 1083 nm光子逃逸几率的理论研究  

Theoretical Study of Photon Escape Probabilities of He Ⅰ 1083nm for Different Plasma Geometries

作　　者：贺健[1] 廖腊梅[2] 张庆国[1] 

机构地区：[1]河南科技大学物理与工程学院,河南洛阳471023 [2]洛阳师范学院物理与电子信息学院,河南洛阳471022

出　　处：《红外》2011年第11期25-28,共4页Infrared

基　　金：河南省教育厅自然科学基础研究项目(2010B140004;2008B140005)

摘　　要：对于无限大平板和无限长圆柱两种等离子几何体,讨论了组成He I 1083 nm共振线的1083.034 nm、1083.025 nm和1082.908 nm三条线的光子逃逸几率。计算了吸收原子在基态上的原子数密度,同时也分析了逃逸因子对谱线中心光学厚度的影响。结果表明,光子逃逸几率随着光学厚度的减小而衰减,无限大平板等离子几何体的光子逃逸几率比无限长圆柱几何体的大,这与实验结果相一致。该研究对于太阳或其他天体中氦浓度的探测具有一定参考意义。According to the infinite slab and infinite cylinder plasma geometries, the photon escape probabilities of three lines of 1083.034 nm, 1083.025 nm and 1082.908 nm constituting the resonance emission line of He I are discussed. The total number of absorbing atoms in ground state is calculated and the dependence of the escape factors on the optical depth in the line center is analyzed. The result shows that the photon escape probability is degraded with the decreasing of optical depth and the photon escape probability of an infinite slab is greater than that of an infinite cylinder plasma geometry. This is in agreement with the experimental result. The study is of significance to the detection of helium density in the sun and other stars.

关 键 词：等离子几何体 光子逃逸几率 光学深度 光谱线型 

分 类 号：O562.3[理学—原子与分子物理]