浅层折射波在覆盖层厚度探测中的研究及应用  

Study and Application of Shallow Seismic Refracted Wave in the Overburden Layer Thickness Detection

作　　者：安岩[1] 邹建[1] 王玉风[1] 江玉乐[1] 

机构地区：[1]成都理工大学,成都市610059

出　　处：《勘察科学技术》2011年第5期51-54,共4页Site Investigation Science and Technology

摘　　要：折射波法勘探可应用于存在波阻抗差异,且基岩的速度大于覆盖层的地层。折射波法的折射波初至易于识别,可得到岩性及完整岩体的界面速度,在评价掩体质量和分类等工程地质问题上有广泛的应用。该文论述了折射波的原理,并通过浅层折射波差数时距曲线求得界面的速度,来得到坝址的覆盖层厚度。The refracted wave method can be applied in the layer which has the wave impedance difference and the better velocity of bedrock. The easily recognized refracted wavecan reflect the lithology and the interface velocity of intact rock tress, and has the wide application in evaluating the blindage quality, classifying and other engineering geologic problems. This paper discusses the theory of refracted wave,and gets the velocity of interface through the differential time-distance curve of shallow refracted wave, which is in order to detect the thickness of the over burden layer.

关 键 词：浅层地震 折射波 覆盖层 应用 

分 类 号：P631.4[天文地球—地质矿产勘探]