PLZT(7/40/60)薄膜介电驰豫特征的研究  

Study on dielectric relaxation characterization of PLZT(7/40/60) films

作　　者：张超[1] 余大书[1] 

机构地区：[1]天津师范大学物理与电子信息学院,天津300387

出　　处：《天津师范大学学报（自然科学版）》2011年第3期41-44,共4页Journal of Tianjin Normal University：Natural Science Edition

基　　金：天津市高等学校科学发展基金资助项目(20041022);天津师范大学博士基金资助项目(5RL019);天津师范大学与上海天泰茶业科技有限公司开发项目(53H10059)

摘　　要：利用溶胶-凝胶技术制备PLZT薄膜,对样品进行X射线衍射和高频介电谱测试,结果表明:薄膜为钙钛矿结构,呈现[110]择优取向,100 MHz介电温谱显示该薄膜具有弛豫铁电体特征,介电频谱表明PLZT薄膜具有介电弛豫特征,体现温度弥散特性,通过理论拟合Cole-Cole曲线得到弛豫时间的分布函数,结合弛豫铁电体特性,对介电频谱的实验与拟合结果进行对比分析.PLZT film prepared by Sol-Gel process was tested for XRD and dielectric spectrum including the dielectric spectrums for temperature and frequency in high frequency.The results showed that the film was perovskite structure and preferred orientation.There is the character of relaxation ferroelectric in the sample,and the sample is relaxation ferroelectric.Based on the dielectric frequency spectrums,the sample has dielectric relaxation feature,and also shows temperature diffusion.The distribution of relaxation time was calculated by means of the Cole-Cole experiment curves fitting.Meanwhile,the experiment and fitting results were analyzed combined with the relaxation ferroelectric features.

关 键 词：PLZT薄膜 溶胶-凝胶法 弛豫铁电体 介电谱 弛豫时间分布 

分 类 号：O484.42[理学—固体物理]