计算导数分光光度法的研究——Ⅰ.钨、钼的同时测定  

STUDIES ON COMPUTATIONAL DERIVATIVE SPECTROPHOTOMETRYⅠ.SIMULTANEOUS DETERMINATION OF TUNGSTEN AND MOLYBDENUM

作　　者：张晶玉[1] 任英[1] 缪平[2] 

机构地区：[1]中国科学院长春应用化学研究所,长春130022 [2]长春地质学院岩化系

出　　处：《应用化学》1990年第5期34-38,共5页Chinese Journal of Applied Chemistry

基　　金：国家自然科学基金

摘　　要：本文以W、MO-SAF-CTMAB体系为例,选取二阶和三阶导数光谱的2个不同波长下的导数值,采用简单解联立方程组的方法即可同时测定钨和钼。本文从原理和实验上证实了计算导数光度法的可行性,提出了以方程组的系数矩阵条件数来指导测量点的选择。The computation method and the differences between components are the dominated factorswhich affect the accuracy of an analytical determination with computation spectrophotometry.Computational-derivative spectrophotometry, based on taking advantage of the higher resolu-tion of derivative spectrum, was proposed for the simultaneous determination of multicompo-nents. The additivity of derivative spectra and the selection of measuring points are impor-tant factors for this method. The measuring points were selected in different order deriva-tive spectrum according to the condition number of the coefficient matrix. The concentrationsof the components were calculated by solving a group of equations. The analytical applicationof the method to the W/Mo-SAF-CTMAB proves that the method is quite simple andaccurate.

关 键 词：钨 钼 同时测定 导数光度法 

分 类 号：O614.612[理学—无机化学]