Influence of CaZrO_3 on dielectric properties and microstructures of BaTiO_3-based X8R ceramics  

作　　者：TANG Bin, ZHANG ShuRen, YUAN Ying, ZHOU XiaoHua & LIANG YiShuai State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu 610054, China 

出　　处：《Science China(Technological Sciences)》2008年第9期1451-1456,共6页中国科学（技术科学英文版）

摘　　要：The influences of CaZrO3 on the dielectric properties and microstructures of BaTiO3 (BT)-based ceramics have been investigated. The experiment results showed that the dielectric constant at room temperature increased with the addition of CaZrO3 in the range of 0―3.0 mol%, which could be explained by the growth of BT grains. XRD analysis revealed that the tetragonality declined as CaZrO3 concentration in-creased. XRD patterns of BT ceramics with different amounts of CaZrO3 doping were analyzed by a recently developed procedure-materials analysis using diffrac-tion (MAUD), which was based on the Rietveld method combined with Fourier analysis. The results depicted that the high temperature peak of tempera-ture-capacitance characteristics (TCC) was largely dependent on the micro-strain of samples. Furthermore, more CaZrO3 doping resulted in lower porosity and higher density. It was revealed that proper usage of CaZrO3 could improve the di-electric properties significantly, which was benefit to develop X8R multi-layer ce-ramic capacitors.The influences of CaZrO3 on the dielectric properties and microstructures of BaTiO3 (BT)-based ceramics have been investigated. The experiment results showed that the dielectric constant at room temperature increased with the addition of CaZrO3 in the range of 0―3.0 mol%, which could be explained by the growth of BT grains. XRD analysis revealed that the tetragonality declined as CaZrO3 concentration in-creased. XRD patterns of BT ceramics with different amounts of CaZrO3 doping were analyzed by a recently developed procedure-materials analysis using diffrac-tion (MAUD), which was based on the Rietveld method combined with Fourier analysis. The results depicted that the high temperature peak of tempera-ture-capacitance characteristics (TCC) was largely dependent on the micro-strain of samples. Furthermore, more CaZrO3 doping resulted in lower porosity and higher density. It was revealed that proper usage of CaZrO3 could improve the di-electric properties significantly, which was benefit to develop X8R multi-layer ce-ramic capacitors.

关 键 词：dielectric properties BARIUM TITANATE TETRAGONALITY temperature-capacitance characteristics calcium ZIRCONATE 

分 类 号：TQ174.12[化学工程—陶瓷工业]