富勒苯固体材料薄膜的激光质谱分析  

The Analysis of Fullerens Thin Film by Laser Mass Spectrometry

作　　者：钟峰[1,2] 赵善楷[1,2] 彭少麒 刘勇[1,2] 

机构地区：[1]中山大学测试中心 [2]中山大学物理学系

出　　处：《中山大学学报（自然科学版）》1996年第S2期180-182,共3页Acta Scientiarum Naturalium Universitatis Sunyatseni

基　　金：国家自然科学基金

摘　　要：在激光微探针飞行时间质谱仪上，选用合适的激光波长（２６６ｎｍ）对不同蒸发温度下得到的不同厚度的富勒苯薄膜进行直接分析测定，结果表明激光微探针质谱法具有极高灵敏度，分析速度快，几乎不损耗样品，操作简便等优点，适于进行富勒苯固体材料薄膜。Fullerense thin film with different thickness obtained at various evaporating temperature have been analyzed directly by a laboratory-built laser mass spectrometer, with laser wavelength of 266 nm. The results are satisfied. It demonstrated that, owing to the very high sensitivity, rapidity, simplicity and almost undestructiveness, laser mass spectrometry is suitable for the analysis of fullerenes thin film, even down to the thickness of 10 nm

关 键 词：激光质谱法 富勒苯 固体薄膜 

分 类 号：O657.6[理学—分析化学]