电子探针搭配波谱仪表征钨铼合金  

Characterization of Re Distribution in W-Re Alloy by Electron Probe with Spectrometer

作　　者：王喆[1] 李运波[1] 卓明川[1] 肖阳[1] 侯占杰[1] 朱玉斌[1] 

机构地区：[1]上海大学材料科学与工程学院,上海200072

出　　处：《稀有金属与硬质合金》2011年第4期47-49,59,共4页Rare Metals and Cemented Carbides

基　　金：上海大学研究生创新基金资助(SHUCX10224)

摘　　要：针对钨铼合金组成元素的原子序数邻近,成分均匀程度难以表征的特点,采用二次电子图像、背散射电子成分衬度图像观察了钨铼合金的抛光截面形貌;并利用扫描电镜配套的电子探计搭配波谱仪,成功区分了钨铼合金抛光截面的高铼区域与低铼区域,清晰显示了铼元素在铼钨合金中的分布情况。从理论上分析了该方法的可行性,从而为钨铼合金等邻近元素合金成分的均匀性分析提供参考。In view of adjacent atomic number, the uniformity of tungsten rhenium alloy is difficult to charac- terize. The tungsten rhenium alloy morphology of polished section is characterized by SEI and BEI. The high rhenium region and the low Re region in the polished section of tungsten rhenium alloy were success- fully classified through a scanning electron microscope with spectrometer. The distribution of Re element in -Re alloy is shown clearly. In addition, the feasibility of this method is analyzed theoretically, as can pro- vide reference for the analysis of the uniformity of the alloys of adjacent elements such as W-Re.

关 键 词：钨铼合金 均匀性 二次电子图像 背散射电子图像 波谱仪面扫描 

分 类 号：TG146.411[一般工业技术—材料科学与工程]