高纯锗探测器的效率曲线和符合因子计算  

HPGe detector efficiency curve and coincidence factor calculation

作　　者：罗奇[1] 胡世鹏[1] 孙慧斌[1] 刘国卿[1] 赵海歌[1] 

机构地区：[1]深圳大学核技术研究所,深圳518060

出　　处：《核技术》2011年第12期901-904,共4页Nuclear Techniques

基　　金：国家自然科学基金(10775098)资助

摘　　要：利用多能量γ射线源^(152)Eu和^(133)Ba测得高纯锗探测器在20 cm处的效率刻度曲线,结合单能量γ射线源^(241)Am和^(137)Cs获得的距离递推关系,得到高纯锗探测器在2 cm处无符合效应的效率刻度曲线。与MCNP模拟计算结果比较,获得^(60)Co在2 cm处的符合相加修正因子。By using multi-gamma ray sources of 152Eu and 133Ba placed 20 cm from the HPGe detector, its detection efficiency was obtained. Combined with the distance recurrence relation, which was derived by single-gamma ray sources of 241Am and 137Cs, the detector efficiency calibration curve at 2 cm could be deduced. Finally, by comparing the experiment results with the simulation results by the MCNP code, the coincidence factor could be determined.

关 键 词：高纯锗探测器 效率刻度 蒙特卡罗 符合修正因子 

分 类 号：O582[理学—物理]