慢波结构冷测系统的研制  

Research and Fabrication of Cold Test System for Slow-wave Structure

作　　者：朱兆君[1] 贾宝富[1] 万德明[1] 位朝垒[1] 王健[1] 

机构地区：[1]电子科技大学物理电子学院,成都610054

出　　处：《空间电子技术》2011年第4期45-49,共5页Space Electronic Technology

摘　　要：文章选择行波法和非谐振微扰法分别作为色散和耦合阻抗的测量方法,并在此基础上搭建了冷测系统。对两种不同类型的慢波结构样品进行了冷测验证,测试结果与仿真结果的平均相对误差小于5%。The traveling-wave method and non-resonant perturbation method are chosen for dispersion test and interaction impedance test respectively. Based on that, the cold-test system is constructed. With the system, the cold-test of two slow-wave structure samples was carried out. The measured results agree with the 3-D EM simulation results very well, and the average relative error is less than 5%.

关 键 词：慢波结构 色散 耦合阻抗 冷测 

分 类 号：TN124[电子电信—物理电子学]