电子产品加速寿命试验研究  

Study on electronic products accelerated life test

作　　者：李军[1] 缪海杰[1] 

机构地区：[1]中国工程物理研究院电子工程研究所,四川省绵阳市621900

出　　处：《电子测试》2011年第11期33-35,共3页Electronic Test

摘　　要：电子产品的使用者希望在其工作寿命内尽可能少发生甚至不发生故障,这对电子产品的可靠性提出了较高的要求。制造者为了确保电子产品的可靠性,必须针对产品作一系列的可靠性试验,加速寿命试验是可靠性试验中最普遍和重要的项目。本文简要介绍加速寿命试验的各种模型和它们的适用条件,分析各种加速寿命试验的优缺点。基于加速寿命试验的基本原理,并根据电子产品的具体特点,探讨了加速寿命试验它在电子产品检验中的具体应用技术。Electronic products users expect that the products occur little even no failure in their working life, which requires high demand in reliability of electronic products. Ensuring the reliability, manufacturer must take series of reliability tests on the products, and accelerated life test is the most common and important projects. This paper briefly describes the various models of accelerated life tests and their application conditions, analyses the advantages and disadvantages of various accelerated life tests. Based on the basic principles of accelerated life test and characteristic of electronic products, this paper discusses it’s utilization in electronic products inspection.

关 键 词：可靠性 加速寿命试验 电子产品 

分 类 号：TN06[电子电信—物理电子学]