土壤重金属镍元素的X射线荧光定量分析  

Quantitative Analysis of Nickel in Soil Samples Using X-Ray Fluorescence Spectroscopy

作　　者：章炜[1] 张玉钧[1] 陈东[1] 

机构地区：[1]中国科学院安徽光学精密机械研究所环境光学与技术重点实验室,安徽合肥230031

出　　处：《激光与光电子学进展》2012年第1期137-140,共4页Laser & Optoelectronics Progress

基　　金：国家自然科学基金(60908018);国家重大科技专项(2009ZX07420-008-005;2008ZX07527-007)资助课题

摘　　要：利用XLt793重金属分析仪,在实验室自然大气环境下获取土壤的X射线荧光,通过X射线荧光光谱法定量分析了国家标准土壤样品中Ni元素的含量。实验研究了在最佳实验条件下土壤中Ni的X射线荧光特征分析谱线,测定了Ni元素的直接校准曲线。实验结果表明,Ni元素质量分数在(50～1000)×10-6范围内,元素含量与特征谱线强度之间具有较好的线性关系;元素Ni强度分析测量的相对标准偏差(RSD)为8.60%,利用相同土壤类型进行定量分析的结果与标准值的相对偏差为4.43%;利用定标曲线对不同土壤类型进行定量分析,元素测量浓度与标准值的相对偏差为7.13%。We quantitatively analyze the content of the element Ni in the Chinese national standard soil samples by the method of X-ray fluorescence spectroscopy using XLt793 metal analyzer in ambient environment of the laboratory. The direct calibration curve of Ni is measured by studying the characteristics of X-ray fluorescence of Ni in the optimal experimental conditions. The experimental results demonstrate that the relation between concentration [mass fraction （50-1000）×10-6] of Ni element and the intensity of the characteristic spectrum is well linear, and the relative standard deviation （RSD） of intensity measurement from the standard value is 8.60%. Using the soil samples of the same type the relative deviation of element analysis of concentration measurement from the standard value is 4.43%. Using calibration curves to analyze the different soil types, the relative deviation between the measured concentration and the standard value is 7.13 %.

关 键 词：光谱学 重金属 X射线荧光 定量分析 定标曲线 

分 类 号：O657.34[理学—分析化学]