X射线荧光光谱分析法同时测定化探样品中多组分的含量  

Simultaneous Determination of Multi-element in Geochemical Exploration Samples by X-Ray Fluorescence Spectrometry

作　　者：乔鹏[1] 葛良全[1] 张庆贤[1] 谷懿[1] 米争锋[1] 

机构地区：[1]成都理工大学核技术与自动化工程学院,四川成都610059

出　　处：《核电子学与探测技术》2011年第11期1295-1299,共5页Nuclear Electronics & Detection Technology

基　　金：西天山航磁异常查证野外X荧光示范课题资助

摘　　要：采用粉末压片制样法,利用PANalytical Axios型波长色散X荧光光谱仪同时对化探样品中的Fe2O3、Al2O3、Cr、Co、Ni、Cu、Zn、Pb等36种主、次和痕量组分进行测定。采用基本参数法,结合PH模式的经验系数法校正光谱干扰和集体效应。用国家标准物质做检验,测量结果与标样认定值吻合,用国家一级标准物质GBW 07401做精密度试验,统计结果RSD(n=10)除Br、Ce、Co、Ge、La、Mo、U、Sn、Sc和Nd小于10%,其余均小于5%。Multi components such as Fe2O3、Al2O3、Cr、Co、Ni、Cu、Zn、Pb in geochemical exploration samples have been measured by pressed powder pellet sample preparation and X—ray fluorescence spectrometry.Basic parameter method combining with PH mode empirical factor method were mainly used to correct spectral interference and matrix effect.Two Chinese national primary reference materialGSD-2a and GBW 07103 were selected for the verification of accuracy of the method and the analytical results were well agreed with the certificate values,GBW 07401 was selected for precision test,Statistical results showed that RSD（n=10） were better than 5.0% for major elements and others,except for Br,Ce,Co,Ge,La,Mo,U,Sn,Sc and Nd（RSD10%）.

关 键 词：X射线荧光光谱分析 粉末压片制样法 化探样品 基本参数法 经验系数法 

分 类 号：O657.34[理学—分析化学]