Bayesian sequential testing for exponential life system with reliability growth  被引量:4

Bayesian sequential testing for exponential life system with reliability growth

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作  者:Yunyan Xing Xiaoyue Wu 

机构地区:[1]College of Information Systems and Management, National University of Defense Technology, Changsha 410073, P. R. China

出  处:《Journal of Systems Engineering and Electronics》2011年第6期1023-1029,共7页系统工程与电子技术(英文版)

基  金:supported by the National Natural Science Foundation of China (70571083);the Research Fund for the Doctoral Program of Higher Education of China (20094307110013)

摘  要:A Bayesian sequential testing method is proposed to evaluate system reliability index with reliability growth during development.The method develops a reliability growth model of repairable systems for failure censored test,and figures out the approach to determine the prior distribution of the system failure rate by applying the reliability growth model to incorporate the multistage test data collected from system development.Furthermore,the procedure for the Bayesian sequential testing is derived for the failure rate of the exponential life system,which enables the decision to terminate or continue development test.Finally,a numerical example is given to illustrate the efficiency of the proposed model and procedure.A Bayesian sequential testing method is proposed to evaluate system reliability index with reliability growth during development.The method develops a reliability growth model of repairable systems for failure censored test,and figures out the approach to determine the prior distribution of the system failure rate by applying the reliability growth model to incorporate the multistage test data collected from system development.Furthermore,the procedure for the Bayesian sequential testing is derived for the failure rate of the exponential life system,which enables the decision to terminate or continue development test.Finally,a numerical example is given to illustrate the efficiency of the proposed model and procedure.

关 键 词:reliability growth Bayesian method prior distribution sequential testing exponential life system. 

分 类 号:O213.2[理学—概率论与数理统计] TP274[理学—数学]

 

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