对夫兰克-赫兹实验屏流曲线的讨论  

DISCUSSION OF SHIELDED CURRENT RATIO CURVE IN FRANCK-HERTZ EXPERIMENT

作　　者：邱正明[1] 郭玉刚[1] 杨旭[1] 

机构地区：[1]中国科学技术大学22系

出　　处：《物理与工程》2011年第6期22-24,28,共4页Physics and Engineering

摘　　要：夫兰克-赫兹(FH)实验是大学物理实验的重要实验,许多研究性课题从中不断产生.对实验曲线产生的机理与分析常常是实验教学中的难题.本文针对学生在FH实验中,对屏流IP曲线产生机理提出的问题,从汞原子的浓度和电子能量的变化系统研究了IP曲线产生机理,对这些问题给予了解释.Frank-Hertz experiment is an important course in the college physics experiments.Many research subjects are produced from this experiment.Generally,it is difficult to analyze the mechanism of the experiment curves.To explain problems about the shielded current ratio curve in Frank-Hertz experiment asked by students,we study the mechanism from the relation between the consistency of Hg atom and the change of electron energy.

关 键 词：波形特性的解释 峰值处电子能量的变化 汞浓度和汞吸收能量 

分 类 号：O562[理学—原子与分子物理]