Scanning Tunneling Microscope Observations of Non-AB Stacking of Graphene on Ni Films  

作　　者：Ruiqi Zhao Yanfeng Zhang Teng Gao Yabo Gao Nan Liu Lei Fu Zhongfan Liu 

机构地区：[1]Center for Nanochemistry （CNC）, Beijing National Laboratory for Molecular Sciences, State Key Laboratory for Structural Chemistry of Unstable and Stable Species, College of Chemistry and Molecular Engineering, Peking University, Beijing 100871, China [2]College of Physics and Chemistry, Henan Polytechnic University, Henan 454003, China [3]Department of Advanced Materials and Nanotechnology, College of Engineering, Peking University, Beijing 100871, China

出　　处：《Nano Research》2011年第7期712-721,共10页纳米研究（英文版）

基　　金：Acknowledgements This work was financially supported by the National Natural Science Foundation of China （Grant Nos. 20973013, 51072004, 50821061, 20833001, 21073003, 20973006, and 50802003） and the Ministry of Science and Technology of China （Grant Nos. 2007CB936203, 2011CB921903, and 2009CB929403）. Ruiqi Zhao also thanks the Doctoral Foundation of Henan Polytechnic University （Grant No. B2009-90）.

摘　　要：Microscopic features of graphene segregated on Ni films prior to chemical transfer--including atomic structures of monolayers and bilayers, Moire patterns due to non-AB stacking, as well as wrinkles and ripples caused by strain effects-have been characterized in detail by high-resolution scanning tunneling microscopy （STM）. We found that the stacking geometry of the bilayer graphene usually deviates from the traditional Bernal stacking （or so-called AB stacking）, resulting in the formation of a variety of Moir6 patterns. The relative rotations inside the bilayer were then qualitatively deduced from the relationship between Moir6 patterns and carbon lattices. Moreover, we found that typical defects such as wrinkles and ripples tend to evolve around multi-step boundaries of Ni, thus reflecting strong perturbations from substrate corrugations. These investigations of the morphology and the mechanism of formation of wrinkles and ripples are fundamental topics in graphene research. This work is expected to contribute to the exploration of electronic and transport properties of wrinkles and ripples.graphene 的显微镜的特征在化学 transferincluding 以前在 Ni 电影上分离了单层和 bilayers 的原子结构， Moir ? 敷敲映牯敭 ? 祢爠汯楬杮甠? 景琠敨愠湮慥敬 ? 佇 ? 湡 ? 桴 ? 楤浡瑥牥 ? 敷敲洠獯汴 ? 湩琠敨爠湡敧 ???

关 键 词：GRAPHENE scanning tunneling microscopy （STM） SEGREGATION Moire pattern growth 

分 类 号：TN16[电子电信—物理电子学] TB383[一般工业技术—材料科学与工程]