田口方法在X射线荧光分析时曲线校正中的应用  

Applycation of Dr Genichi Taguchi Method in the Curve Calibration of X-Ray Fluorescence Analysis

作　　者：张爱武[1] 邓永红[1] 

机构地区：[1]吉林江北机械制造有限责任公司计量理化中心,吉林市132021

出　　处：《化学分析计量》2012年第1期85-87,共3页Chemical Analysis And Meterage

摘　　要：根据田口玄一博士在测量工程学中提出的信噪比概念,计算了X荧光分析中某一标准曲线极限信噪比。当日常测试中系统的信噪比大于极限值时,不需要对曲线进行校正;当日常测试中系统的信噪比小于极限值时,应对曲线进行校正,以保证该测量系统工作的稳定性。According to the concept of signal to noise ratio put forward by Dr Genichi Taguchi in measurement engineering, one of the standard curve limit signal to noise ratio in the X-ray fluorescence analysis was calculated. When the daily testing signal to noise ratio is less than the limit value, the drift correction should be carried out. When the daily testing signal to noise ratio is more than the limit value, the drift correction needn＇t be carried out .

关 键 词：信噪比 漂移 校正 X射线荧光分析 

分 类 号：O657-34[理学—分析化学]