热红外低比辐射率高漫反射比表面的分形表征  

Fractal Characterization of the Rough Surface with Low Emissivity and High Diffuse Reflectance in Thermal Infrared

作　　者：徐则川[1] 刘卫忠[1] 卢德新[1] 刘丽丽 

机构地区：[1]华中理工大学电子科学与技术系

出　　处：《华中理工大学学报》2000年第1期76-78,共3页Journal of Huazhong University of Science and Technology

基　　金：国家自然科学基金资助项目! ( 695770 0 7)

摘　　要：采用 DFBIR模型分析了热红外低比辐射率高漫反射比粗糙表面的宏观分维特性 ,利用 SEM表面形貌图和图像处理系统 S60 0计算了宏观分维数 .为了描述本粗糙表面的微观分形特征 ,采用 W-M函数作为其数学模型 ,设计了随机分形算法 ,对粗糙表面 STM微观形貌进行了分形分析并计算了微观分维数 .研究结果表明 ,热红外低比辐射率高漫反射比粗糙表面不仅是分形表面 ,而且是多尺度分形表面 ,分维数 D与比辐射率ε及漫反射比 DR 均成正相关关系 。The macro fractal characterization of the rough surface with low emissivity and high diffuse reflectance is analyzed by DFBIR model, and the macro fractal dimension is calculated by using SEM topography and graphic processing system S600. In order to describe micro fractal characterization of the rough surface, we use W M function as the mathematical model of the micro fractal surface and build a random fractal algorithm. Using this algorithm the micro fractal dimension of the micro topographies of the rough surface taken by STM is calculated. It is shown from the investigation that the rough surface is not only a fractal surface but also a multi scale fractal one. There are positive correlation between fractal dimension D and emissivity εas well as diffuse reflectance DR. The rough surface has different fractal dimensions, which shows same IR characteristics but different substrates.

关 键 词：粗糙表面 比辐射率 漫反射比 热红外散射 分形 

分 类 号：TG84[金属学及工艺—公差测量技术] O434.3[机械工程—光学工程]