基于多频外差原理的相位解包裹方法  

Phase unwrapping method base on multi-frequency interferometry

作　　者：陈玲[1] 邓文怡[1] 娄小平[1] 

机构地区：[1]北京信息科技大学光电信息与通信工程学院,北京100192

出　　处：《光学技术》2012年第1期73-78,共6页Optical Technique

基　　金：北京市属高等学校人才强教计划资助项目(PHR201107130)

摘　　要：根据多频外差原理推导了三频光栅条纹解包裹的过程,获取了光栅条纹的绝对相位值。同时,为了减小误差,提高测量精度,提出了一种相位修正的方法,比较了相位修正前后的相位图,表明该方法能够非常有效地去除相位误差。通过将修正后的绝对相位值作为匹配的一个特征量,利用机器视觉中双目立体视觉的方法求取物体的三维特征。实验证实了该方法的可行性,并得到良好的测量结果。In order to obtain the absolute phase value of a surface in phase measuring profilometry(PMP),a phase unwrapping method based on multi-frequency interferometry by projecting three different frequency fringes is deduced.Meanwhile,in order to reduce errors and improve measuring accuracy,a phase correction method is proposed and a comparision between the original and revised images is made.This method can very effectively remove the phase error.On the revised absolute phase value as a feature for matching in stereo binocular vision,the object of three-dimensional features can be calculated based on stereo binocular visual method.The experiment shows that this method is feasible,and a good measurement result is obtained.

关 键 词：相位测量 多频外差 相位解包裹 光学测量 

分 类 号：TP391[自动化与计算机技术—计算机应用技术]