基于Object-Z与Markov链的校园卡系统测试用例  

Test Case Generator for Campus-wide Card System Based on Object-Z and Markov

作　　者：仲晓敏[1] 侯建花[2] 杨长青[2] 

机构地区：[1]淮海工学院计算机工程学院,江苏连云港222005 [2]淮海工学院理学院,江苏连云港222005

出　　处：《微电子学与计算机》2012年第3期73-77,共5页Microelectronics & Computer

基　　金：国家自然科学基金项目(50806011)

摘　　要：针对提高校园卡系统准确性和可靠性测试的要求,提出了Object-Z与Markov链结合的测试用例自动生成算法.使用Object-Z对系统进行形式化规约,生成测试场景和操作顺序图;将操作顺序图转换为Markov链使用模型;根据测试场景和Markov链使用模型生成数量相对合理的测试用例.该方法无需对系统进行运行,在需求分析与测试阶段就能对系统的功能进行测试.生成的校园卡系统测试用例证明该方法是有效的,并且在提高测试覆盖率的同时,使用Markov链也能保证对系统的可靠性测试.For improving the accuracy and reliability of the Campus card system test requirement,test cases generator based on Object-Z and Markov chain is proposed in this paper.The formal specification of the system is gained by using Object-Z,then test scenarios and operation sequence diagrams are generated.Operation sequence diagrams are converted into a Markov chain usage model.According to the test scenarios and the Markov chain model to produce a relatively reasonable amount of test cases.The method don＇t need to run the system,and could be able to test the functionality of the system in the time of requirements analysis.The results of generated test cases for campus-wide card system show the method is effective,and using the Markov chain ensures the reliability of the system test.

关 键 词：校园卡系统 OBJECT-Z 测试场景 MARKOV链 使用模型 测试用例 

分 类 号：TP311[自动化与计算机技术—计算机软件与理论]