用地层微电阻率扫描成像测井识别沉积构造特征  

Features Recognition of Sedimentary Structure on Formation Microscanner Log

作　　者：吴文圣[1] 陈钢花[1] 王中文[1] 雍世和[1] 

机构地区：[1]石油大学

出　　处：《测井技术》2000年第1期60-63,共4页Well Logging Technology

摘　　要：吴文圣 ,陈钢花 ,王中文等 .用地层微电阻率扫描成像测井识别沉积构造特征 .测井技术 ,2 0 0 0 ,2 4(1) :6 0～ 6 3地层微电阻率扫描测井是新一代成像测井技术的典型代表 ,具有极高的垂向分辨率 ,能直观显示井壁地层的微细变化。识别地层的沉积构造特征是 FMI图像的一个重要应用 ,也是分析沉积环境、进行地层划分和对比的重要依据。着重介绍了各种沉积、构造特征 (层理构造、层面构造、变形构造、化学成因构造、生物成因构造、断层、褶皱等 )在Formation microscanner log represents a new generation of imaging technology. It has high resolution and its image shows intuitively the subtle changes of sidewall formation.One of its important uses is to describe the features of sedimentary structure. It provides a ground for analysing sedimentary environment, zoning and formation correlation.Identification modes of all sorts of features of sedimentary structure on FMI images are given, which includes bedding texture,bedding plane texture,deformation texture,chemogenic texture,biogenic texture,fault and fold, etc.

关 键 词：地层微扫描测井 沉积构造 测井 电测井 

分 类 号：P631.811[天文地球—地质矿产勘探]