因子分析在X射线荧光光谱重叠谱峰识别中的应用  

Application of Factor Analysis to Identification of Overlapped Spectrum in XRF

作　　者：甘露[1] 罗立强[1] 吴晓军[1] 

机构地区：[1]中国地质科学院岩矿测试技术研究所,北京100037

出　　处：《光谱学与光谱分析》2000年第1期91-94,共4页Spectroscopy and Spectral Analysis

摘　　要：用渐进因子分析 (EFA)方法处理合金样品的X射线荧光扫描谱数据 ,按照数学原理选取扫描步长 ,根据XRF特性选择合适的训练集建立数学模型 ,可以准确判断谱峰重叠 ,该方法在合理取点和组分含量相当的情况下有良好的识别能力。EFA method has been used in the processing of qualitative XRF data for metal alloys.With mathematically selected scanning steps and a mathematical model based on suitable trainning set selection,the method can correctlly identify spectrum overlaps.Studies reveal that identification ability can be affected by the number of data points and the concentrations of the overlapping elements.

关 键 词：因子分析 X射线荧光光谱 重叠谱识别 合金样品 

分 类 号：TG115.336[金属学及工艺—物理冶金] O65－37[金属学及工艺—金属学]