Weibull分布下基于MAM的白光OLED寿命预测  

Life Prediction of White OLED under Weibull Distribution Based on MAM

作　　者：成贵学[1] 蒋晓锋 汤勇奇 张建平[1] 朱文清[3] 邬炯磊[1] 

机构地区：[1]上海电力学院能源与环境工程学院,上海200090 [2]上海天逸电器有限公司,上海201611 [3]上海大学新型显示技术及应用集成教育部重点实验室,上海200072

出　　处：《半导体光电》2012年第1期26-29,共4页Semiconductor Optoelectronics

基　　金：新型显示技术及应用集成教育部重点实验室项目(上海大学)(P201002);上海市科委项目(09dz1202500;10dz1140206);上海市自然科学基金项目(09ZR1413000;11ZR1414200);上海市教育委员会科研创新项目(11ZZ172;11ZZ171);上海市教委重点学科项目(第五期)(J51304);上海市教委第三期本科教育高地建设项目

摘　　要：为了得到白光有机发光二极管(OLED)寿命信息,降低试验成本,开展了三组恒定电流应力加速寿命试验。采用Weibull函数描述其寿命分布,基于图分析法(MAM)和MATLAB绘制的Weibull概率双坐标纸,描点作图并估计形状参数和尺度参数,实现了白光OLED的寿命预测。数值结果表明,白光OLED样品在各加速应力下失效机理保持不变,加速模型满足逆幂定律,精确计算的加速参数使得OLED寿命快速估算成为可能。In order to acquire its life information and reduce the test cost,three accelerated life tests were conducted on white OLED at constant current stresses.Weibull function was applied to describe the OLED life distribution.Based on Map Analysis Method（MAM） and double coordinates paper of Weibull probability obtained by MATLAB program,OLED life prediction can be achieved by plotting data points and estimating accelerated parameters.The numerical results indicate that the failure mechanism of OLED samples under all stress levels keeps unchanged,the accelerated model satisfies the inverse power law,and the accelerated parameter which is accurately calculated enables rapid prediction of white OLED life.

关 键 词：白光OLED 寿命预测 WEIBULL分布 图分析法 

分 类 号：TN873.3[电子电信—信息与通信工程]