透射电子显微镜与选区电子衍射对纳米材料的联合分析  

Application of TEM and SAED on inorganic nano-materials

作　　者：欧阳健明[1] 夏志月[1] 鲁鹏[1] 

机构地区：[1]暨南大学生命科学技术学院生物矿化与结石病防治研究所,广东广州510632

出　　处：《暨南大学学报（自然科学与医学版）》2012年第1期87-93,110,共8页Journal of Jinan University(Natural Science & Medicine Edition)

基　　金：国家自然科学基金项目(81170649);广东省科技攻关项目(2009B030801236)

摘　　要：随着纳米材料的发展,必须建立起有效的手段来认识纳米粒子.透射电子显微镜(TEM)能在纳米尺度上实现对待测样品形貌、尺寸的分析;结合选区电子衍射(SAED),可以更进一步实现对待测样品的晶体结构、晶相组成的鉴定,从而提高样品分析的准确度和可靠性.本文综述了TEM与SAED联合分析的优点及其在微电子器件、高温结构材料、生物矿物等领域的研究进展,并对其未来的发展方向进行了展望.With the development of material science, it is necessary to build effective methods to understand nano-particles. Transmission electron microscope （TEM） can be used to measure size and morphology of nano-particles. Combined with selected area electron diffraction （ SAED）, it could further identify the crystal phases and structure of samples, thus to increase the accuracy and reliability in the analysis of samples. In the paper the advantages of combination of TEM and SAED are presented. The progress of application of TEM and SAED on microelectronic devices, high temperature structural materials and biominerals are reviewed. The problems faced and the developing directions were also indicated.

关 键 词：透射电子显微镜(TEM) 选区电子衍射(SAED) 纳米材料 

分 类 号：O611.4[理学—无机化学]