Z箍缩等离子体均匀色散晶体光谱成像  

Z-pinch plasma spectral imaging with uniform dispersion crystal

作　　者：鲁建[1] 阳庆国[2] 肖沙里[1] 黄显宾[2] 蔡红春[2] 

机构地区：[1]重庆大学光电技术及系统教育部重点实验室,重庆400030 [2]中国工程物理研究院流体物理研究所,四川绵阳621900

出　　处：《强激光与粒子束》2012年第2期357-360,共4页High Power Laser and Particle Beams

基　　金：国家自然科学基金项目(11005098)

摘　　要：为了诊断Z箍缩等离子体X射线相关信息,利用自聚焦和均匀色散原理,研制了一种新型的均匀色散弯晶谱仪。晶体分析器采用α-石英(1010),布拉格角为43.4°～72.7°,利用有效面积为10mm×50mm的X射线胶片接收光谱信号,实验在中国工程物理研究院阳加速器装置上进行,摄谱元件获得了Z箍缩铝丝阵等离子体的类H及类He谱线。实验结果表明:谱线分布遵循均匀色散条件,所研制均匀色散弯晶谱仪线色散率为-116.198mm/nm,与理论值-120mm/nm的相对误差为3.168%,能够用于Z箍缩等离子体X射线的光谱学研究。Based on the self-focusing and uniform dispersion principle, a spectrograph with uniform dispersion bent crystal was developed for Z-pinch plasma X ray diagnosis, α-quartz （1010） crystal was used as dispersion element and the Bragg angle of the crystal analyzer ranged from 43.4° to 72.7°. The X-ray film was employed to receive the spectra with an effective area of 10 mm× 50 mm. The experiment was carried out at the Yang accelerator in China Academy of Engineering Physics. The H-like and Hmlike spectra of aluminum Z-pinch plasma were obtained. The distribution of aluminum spectra satisfies the uniform dispersion condition. The linear dispersion of the developed spectrograph is -116. 198 mm/nm and the error is only 3. 168% relative to the theoretical value of -120 mm/nm. The experimental results demonstrate that the uniform dispersion bent crystal spectrograph is suitable for Z pinch plasma X-ray spectroscopy diagnosis.

关 键 词：Z箍缩等离子体 弯晶谱仪 均匀色散 晶体分析器 X射线诊断 

分 类 号：O434.13[机械工程—光学工程]