磁性薄膜噪声测量系统研制  

Development of noise measurement system for magnet films

作　　者：李建伟[1] 滕蛟[1] 

机构地区：[1]北京科技大学材料科学与工程学院,北京100083

出　　处：《磁性材料及器件》2012年第2期56-59,共4页Journal of Magnetic Materials and Devices

摘　　要：利用惠斯通电桥和两极放大电路在磁屏蔽腔中设计开发了磁性薄膜低频噪声测量系统。通过内推法和外比法测试证明该系统测量精度高,稳定性好,能够完成加磁场环境下的低频噪声测量。利用此系统发现各向异性磁电阻元件在退火后1/f噪声明显降低。该装置对于磁性薄膜提供了一种非破坏的有效检测手段,同时也提供了检测磁性转变内在机制的一种有效途径。The noise measurement system for magnet films was develope.d in magnetic shielding using Wheatstone bridge and two-grade amplifiers. It has high accuracy and stability in magnet field which was approved by interpolation and comparison method. With this system it was found that the 1/f noise in AMR was reduced after annealing. It has provided both a method of improving the quality of magnet films and an approach to inner mechanism of magnetic change.

关 键 词：磁性薄膜 1/f噪声 测量 惠斯通电桥 内推法 外比法 

分 类 号：O484.43[理学—固体物理] TM93[理学—物理]