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作 者:陈灵芝[1] 牟达[1] 李全勇[1] 胡初强[1]
机构地区:[1]长春理工大学现代光学测量技术实验室,吉林长春130022
出 处:《激光与光电子学进展》2012年第4期124-128,共5页Laser & Optoelectronics Progress
摘 要:针对测量红外目标模拟器的辐照度值所设计的辐照度测量系统,其光学系统特点是改善辐射光束的能量分布,将能量集中到探测器上。根据双色和单色探测器的不同用途,单个双色探测器和两个单色探测器的双色红外共光路光学系统均能够满足辐照度测量系统的需求。双色探测器难以得到,但对应的光学系统结构简单,调制传递函数响应度高,实用性强;单色探测器容易得到,但对应的光学系统结构复杂,不过仍然有很好的像质,满足辐照度测量光学系统的要求。光学设计结果表明,3~5μm的中红外波段和8~12μm的长波红外波段在两个系统中同时较好地完成了像差校正,系统畸变都很小,最大不超过0.7%,调制传递函数曲线均接近衍射极限。Irradiance measurement system is designed for the irradiance measurement of infrared(IR) target simulator.Its optical system is featured in improving the energy distribution of irradiating light beam and focusing the energy onto the detector.According to the different usages of dual-color and single-color infrared focal plane arrays(IRFPA),co-aperture optical systems of both a dual-color IRFPA detector and two single-color IRFPA detectors can meet the irradiance measurement requirements.Dual-color detector is difficult to obtain but the structure is simple,the modulation transfer function(MTF) response is higher,and the utility is better;on the other hand,the single-color detector is easy to obtain but the structure is relatively complicated.However,the latter still has a good imaging quality and can be used in the optical system.The design result shows that the aberrations in the wave bands of mid-IR(3~5 μm) and middle IR(8~12 μm) are simultaneously adjusted in both systems.The system distortion is small,with the maximum no more than 0.7%,and the MTF approaches the diffraction limit.
关 键 词:光学设计 红外系统设计 双色红外 共光路 辐照度测量
分 类 号:TN216[电子电信—物理电子学]
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