红外系统微扫描技术研究  

Research of Infrared Micro-Scanning Technology

作　　者：张良[1] 仇振安 杨小儒[1] 刘玉[1] 

机构地区：[1]中国航空工业集团公司洛阳电光设备研究所,河南洛阳471009 [2]陆航驻北京地区军事代表室,河南洛阳471009

出　　处：《激光与光电子学进展》2012年第4期134-139,共6页Laser & Optoelectronics Progress

摘　　要：介绍了微扫描技术及其给红外焦平面阵列(FPA)成像带来的好处,分析了微扫描红外焦平面阵列成像方案的特点,比较了各种微扫描成像方案的优势及不足,指出了红外焦平面阵列微扫描成像工程化的可行方案和研究方向。设计了一种采用非制冷氧化钒384pixel×288pixel焦平面探测器的长波红外微扫描光学系统。其工作波长范围为8～14μm,F数为1,焦距为150mm。利用光学设计软件CodeⅤ进行了仿真计算,对其像质进行了评价,并给出了微扫描系统的配置方案。Micro-scanning technique and its benefits in infrared focal plane array（FPA） imaging are discussed.Different micro-scanning schemes and their property are described in detail.The advantages and drawbacks of each scheme are compared.The possible schemes for engineering application are presented.The research direction in micro-scanning infrared focal plane array imaging is pointed out.As an example,we design a micro-scanning optical system suitable for long wave infrared optical system whose operating wavelength range is 8~14 μm,F number is 1,and focal length is 150 mm.It was an uncooled 384 pixel×288 pixel VOx focal plane array detector.Moreover,its image quality is evaluated with the Code Ⅴ optical design software.And the infrared mico-scanning system configuration is also introduced.

关 键 词：光学器件 微扫描技术 红外焦平面 微扫描模式 光学仿真 

分 类 号：TN215[电子电信—物理电子学]