基于内建自测的软错误与老化在线检测  

Soft Error and Aging Online Detection Based on Built-in Self Test

作　　者：杨叔寅[1] 秦晨飞[2] 黄正峰[2] 梁华国[2] 

机构地区：[1]合肥工业大学计算机与信息学院,合肥230009 [2]合肥工业大学电子科学与应用物理学院,合肥230009

出　　处：《计算机工程》2012年第8期235-238,共4页Computer Engineering

基　　金：国家自然科学基金资助项目(60876028);教育部博士点基金资助项目(200803590006);安徽高校省级自然科学研究基金资助重点项目(KJ2010A280);国家自然科学基金青年科学基金资助项目(61106038);合肥工业大学博士学位人员专项基金资助项目(GDBJ2010-002);合肥工业大学科学研究发展基金资助项目(2010HGXJ0071)

摘　　要：负偏置温度不稳定性为主的老化会造成时序违规故障及软错误故障。为此,提出软错误与老化在线检测器(SEAOS)。在器件正常工作的情况下,在线检测上述2种故障。复用并发内建逻辑块观察器,使得硬件开销不超过30%。实验结果表明,在0.18μm工艺尺寸下,与经典检测结构相比,SEAOS有较好的检测能力,且硬件开销较少。Aiming at the dominant aging mechanism induced by Negative Bias Temperature Instability（NBTI） and the soft error, e.g. Single Event Upset（SEU）, affect the normal operation of the device, this paper presents a sensor called Soft Error and Aging Online Sensor（SEAOS） that can on-line detect soft error and aging when the device is under its normal operation, to against SEU and the timing violations induced by aging. Due to the reuse of Concurrent Built-in Logic Block Observer（CBILBO）, the hardware overhead below 33.46% is well tolerated. Experimental results demonstrate that, compared with several classical structures by employing 0.18 μm technology process, SEAOS has a good capacity of detection and a lower hardware overhead.

关 键 词：软错误与老化在线检测器 老化 单事件翻转故障 复用 负偏置温度不稳定性 内建逻辑块观察器 

分 类 号：TP391.6[自动化与计算机技术—计算机应用技术]