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机构地区:[1]中国科学院上海技术物理研究所,上海200083 [2]中国科学院研究生院,北京100039
出 处:《红外技术》2012年第4期237-242,共6页Infrared Technology
基 金:中国科学院创新基金资助项目
摘 要:非均匀性是制约红外系统成像质量的关键因素之一。提出了非均匀性对目标检测影响程度的分析方法,给出了不同性能的目标检测系统对于非均匀性的指标要求。该方法首先采用点光源成像实验仿真了非均匀性和信杂比的关系,然后根据N-P准则(Neyman-Person Criterion)从理论上推导了信杂比与检测概率和虚警概率的关系。实验结果表明,非均匀性每增大1%,检测概率降低15%左右,当非均匀性达到10%时基本失去目标检测功能。当虚警概率降低到5%左右后将不再受非均匀性的影响。Non-uniformity is the main constraint for the image quality of infrared systems.Analysis approach for non-uniformity influence on target detection was proposed,and the indicators of non-uniformity were provided to satisfy different target detector systems.First,point light source was used for simulating the relationship between non-uniformity and SCR.Then,the impacts of SCR on probability of detection and false alarm were derived based on Neyman-Person Criterion.Experimental results show that each increase of 1% of non-uniformity will cause probability of detection decrease almost 15%.While non-uniformity reaches 10%,the detection system is basically useless.The probability of false alarm reduces with the increases of non-uniformity,and the non-uniformity has no impact on the probability of false alarm when it decreases to 5%.
分 类 号:TN215[电子电信—物理电子学]
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