基于边界扫描技术的板级测试分析  

Based on the test of board-level boundary-scan technology to analyze

作　　者：朱振军[1] 林明[1] 宋月丽[2] 

机构地区：[1]江苏科技大学电子信息学院,江苏镇江212003 [2]中国船舶重工集团第723研究所,江苏扬州225001

出　　处：《电子设计工程》2012年第9期127-129,133,共4页Electronic Design Engineering

摘　　要：随着支持IEEE1149.1标准的边界扫描芯片的广泛应用,传统的电路板测试方法如使用万用表、示波器"探针",已不能满足板级测试的需求,相反一种基于板级测试的边界扫描技术得到了迅速发展。对边界扫描测试技术的原理进行了剖析,根据边界扫描测试系统的使用规则对板级测试方法进行了分析、提出了整体测试流程,最后在通用测试的基础上进行了二次开发,提出了提高电路板测试覆盖率的方法。With the support of IEEE 1149.1 standard boundary-scan chips widely used,the traditional method of circuit board test can not meet the needs of board-level testing,for example,using a muhimeter, oscilloscope ＂Probe＂ . On the contrary,a based on board-level boundary-scan testing technique has been developed rapidly.The article analyzed the principle of boundary-scan testing technology, According to the rules of the boundary-scan testing system, the article analyzed the method of board-level testing,raised the overall testing process.Finally, a secondary development was considered on the basis of universal testing,the method of improving the circuit board testing coverage was proposed.

关 键 词：边界扫描 板级测试 二次开发 覆盖率 

分 类 号：TM133[电气工程—电工理论与新技术]