光栅投影轮廓测量的系统标定技术  

System calibration technique of profilometry by projected grating

作　　者：许庆红[1] 钟约先[1] 由志福[1] 

机构地区：[1]清华大学机械工程系,北京100084

出　　处：《光学技术》2000年第2期126-129,共4页Optical Technique

摘　　要：针对在光栅投影轮廓测量术中系统标定可操作性不强、精度不高的问题进行了全面的分析 ,在此基础上提出一种新的系统结构 ,并推导了物相关系。由于去掉了传统结构的平行和垂直两个约束条件 ,测量系统中摄像机和投影装置可以采取任意相对位置 ,操作十分灵活。对新系统提出了方便实用的标定方法 ,在其中引入了摄像机定标技术。应用该测量系统和标定技术进行实例检测 ,测量结果证明 :与传统方法相比 。In this paper, comprehensive analysis is performed aiming at the problem of inferior precision and bad maneuverability during system calibration of automatic profilometry by projected grating. Based on it, a new system construction is proposed and the object phase relation is derived. Because of without parallel and perpendicular restricted conditions in the conventional system construction, the CCD camera and the projecting device can be located arbitrarily. By importing the camera calibration technique, a convenient and practical calibration method is proposed. The new system and calibration method have been applied to the experiment, and the results prove that the system has better maneuverability and higher accuracy than the conventional method.

关 键 词：三维轮廓术 系统结构 标定 物相关系 

分 类 号：TH741.6[机械工程—光学工程]